U.S. Code of Federal Regulations
Regulations most recently checked for updates: Apr 01, 2023
§ 469.20 - Applicability.
(a) The provisions of this subpart are applicable to discharges resulting from the manufacture of electronic crystals.
(b) [Reserved]
§ 469.21 - Compliance dates.
The compliance date for the BAT fluoride limitation is as soon as possible as determined by the permit writer but in no event later than November 8, 1985. The compliance date for PSES for total toxic organics (TTO) is July 1, 1984 and for arsenic is November 8, 1985.
§ 469.22 - Specialized definitions.
The definitions in 40 CFR part 401 and the chemical analysis methods in 40 CFR part 136 apply to this subpart. In addition,
(a) The term “total toxic organics (TTO)” means the sum of the concentrations for each of the following toxic organic compounds which is found in the discharge at a concentration greater than ten (10) micrograms per liter:
(b) The term “electronic crystals” means crystals or crystalline material which because of their unique structural and electronic properties are used in electronic devices. Examples of these crystals are crystals comprised of quartz, ceramic, silicon, gallium arsenide, and idium arsenide.
(c) The term “manufacture of electronic crystals” means the growing of crystals and/or the production of crystal wafers for use in the manufacture of electronic devices.
§ 469.23 - Monitoring.
The certification alternative to monitoring for Total Toxic Organics (TTO) described in § 469.13 (a), (b), (c), and (d) is applicable to this subpart.
§ 469.24 - Effluent limitations representing the degree of effluent reduction attainable by the application of the best practicable control technology currently available (BPT).
Except as provided in 40 CFR 125.30 through 32, any existing point source subject to this subpart must achieve the following effluent limitations representing the degree of effluent reduction attainable by the application of the best practicable control technology currently available (BPT):
Subpart B—Electronic Crystals BPT Effluent Limitations
Pollutant or pollutant property | Maximum for any 1 day | Average of daily values for 30 consecutive days |
---|---|---|
Milligrams per liter (mg/l) | ||
TTO 1 | 1.37 | ( 3) |
Arsenic (T) 2 | 2.09 | 0.83 |
Fluoride (T) | 32.0 | 17.4 |
TSS | 61.0 | 23.0 |
pH | ( 4) | ( 4) |
1 Total toxic organics.
2 The arsenic (T) limitation only applies to manufacturers of gallium or indium arsenide crystals.
3 Not applicable.
4 Within the range of 6.0 to 9.0.
§ 469.25 - Effluent limitations representing the degree of effluent reduction attainable by the application of the best available technology economically achievable (BAT).
Except as provided in 40 CFR 125.30 through 32, any existing point source subject to this subpart must achieve the following effluent limitations representing the degree of effluent reduction attainable by the application of the best available technology economically available (BAT):
Subpart B—Electronic Crystals BAT Effluent Limitations
Pollutant or pollutant property | Maximum for any 1 day | Average of daily values for 30 consecutive days |
---|---|---|
Milligrams per liter (mg/l) | ||
TTO 1 | 1.37 | ( 3) |
Arsenic 2 | 2.09 | 0.83 |
Fluoride | 32.0 | 17.4 |
1 Total toxic organics.
2 The arsenic limitation only applies to manufacturers of gallium or indium arsenide crystals.
3 Not applicable.
§ 469.26 - Pretreatment standards for existing sources (PSES).
(a) Except as provided in 40 CFR 403.7 and 403.13, any existing source subject to this subpart which introduces pollutants into a publicly owned treatment works must comply with 40 CFR part 403 and achieve the following pretreatment standards for existing sources (PSES):
Subpart B—Electronic Crystals PSES Effluent Limitations
Pollutant or pollutant property | Maximum for any 1 day | Average of daily values for 30 consecutive days |
---|---|---|
Milligrams per liter (mg/l) | ||
TTO 1 | 1.37 | ( 2) |
Arsenic (T) 3 | 2.09 | 0.83 |
1 Total toxic organics.
2 Not applicable.
3 The arsenic (T) limitation only applies to manufacturers of gallium or indium arsenide crystals.
(b) An existing source submitting a certification in lieu of monitoring pursuant to § 469.13 (c) and (d) of this regulation must implement the solvent management plan approved by the control authority.
§ 469.27 - New source performance standards (NSPS).
Any new source subject to this subpart must achieve the following new source performance standards (NSPS):
Subpart B—Electronic Crystals NSPS Effluent Limitations
Pollutant or pollutant property | Maximum for any 1 day | Average of daily values for 30 consecutive days |
---|---|---|
Milligrams per liter(mg/l) | ||
TTO 1 | 1.37 | ( 2) |
Arsenic(T) 3 | 2.09 | 0.83 |
Fluoride(T) | 32.0 | 17.4 |
TSS | 61.0 | 23.0 |
pH | ( 4) | ( 4) |
1 Total toxic organics.
2 Not applicable.
3 The arsenic(T) limitation only applies to manufacturers of gallium or indium arsenide crystals.
4 Within the range of 6.0 to 9.0.
§ 469.28 - Pretreatment standards for new sources (PSNS).
Except as provided in 40 CFR 403.7, any new source subject to this subpart which introduces pollutants into a publicly owned treatment works must comply with 40 CFR part 403 and achieve the following pretreatment standards for new sources (PSNS):
(a)
Subpart B—Electronic Crystals PSNS Effluent Limitations
Pollutant or pollutant property | Maximum for any 1 day | Average of daily values for 30 consecutive days |
---|---|---|
Milligrams per liter (mg/l) | ||
TTO 1 | 1.37 | ( 2) |
Arsenic (T) 3 | 2.09 | 0.83 |
1 Total toxic organics.
2 Not applicable.
3 The arsenic (T) limitation only applies to manufacturers of gallium or indium arsenide crystals.
(b) A new source submitting a certification in lieu of monitoring pursuant to § 469.13(c) and (d) of this regulation must implement the solvent management plan approved by the control authority.
§ 469.29 - Effluent limitations representing the degree of effluent reduction attainable by the application of the best conventional pollution control technology (BCT).
Except as provided in 40 CFR 125.30 through 32, any existing point source subject to this subpart must achieve the following effluent limitations representing the degree of effluent reduction attainable by the application of the best conventional pollution control technology (BCT):
Subpart B—Electronic Crystals BCT Effluent Limitations
Pollutant or pollutant property | Maximum for any 1 day | Average of daily values for 30 consecutive days |
---|---|---|
Milligrams per liter (mg/l) | ||
TSS | 61.0 | 23.0 |
pH | ( 1) | ( 1) |
1 Within the range of 6.0 to 9.0.